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INTERNATIONAL JOURNAL OF ENGINEERING DEVELOPMENT AND RESEARCH
(International Peer Reviewed,Refereed, Indexed, Citation Open Access Journal)
ISSN: 2321-9939 | ESTD Year: 2013

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Paper Title
p-mean Model impact on VLSI Placement
Authors
  B N Bhramar Ray

Abstract
In this paper we compare the impact of of p-mean Half-perimeter wirelength (HPWL) model on analytical placement of VLSI. against logarithm-sum-expontial (LSE) wirelength model, weighted average(WA) [3]and (γ,p)[8] wirelength models.. Deployment of the wirelength model in analytical placement engine produces 12%, 10% and 1% shorter wirelength than widely used LSE and recently proposed weighted average(WA) [3]and (γ,p)[8] wirelength models.

Keywords- VLSI; analytical placemet; wirelength; simulated annealing
Publication Details
Unique Identification Number - IJEDR1503009
Page Number(s) -
Pubished in - Volume 3 | Issue 3 | July 2015
DOI (Digital Object Identifier) -   
Publisher - IJEDR (ISSN - 2321-9939)
Cite this Article
  B N Bhramar Ray,   "p-mean Model impact on VLSI Placement", International Journal of Engineering Development and Research (IJEDR), ISSN:2321-9939, Volume.3, Issue 3, pp., July 2015, Available at :http://www.ijedr.org/papers/IJEDR1503009.pdf
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