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INTERNATIONAL JOURNAL OF ENGINEERING DEVELOPMENT AND RESEARCH
(International Peer Reviewed,Refereed, Indexed, Citation Open Access Journal)
ISSN: 2321-9939 | ESTD Year: 2013

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Paper Title
Fault testing using SCOAP - Sandia controllability /observability analysis program
Authors
  Neha Shukla,  Karan Chandel

Abstract
This paper describes about SCAOP for testing digital circuits. Controllability and observability of various nodes of digital circuit plays important role in testing digital circuit and detecting faults. SCOAP is a program developed by Sandia national laboratories basically deployed for testing digital circuits. This paper describes the implementation of SCOAP using an illustration of digital circuit and its drawbacks.

Keywords- controllability , observability ,sandia
Publication Details
Unique Identification Number - IJEDR1702313
Page Number(s) - 2013-2017
Pubished in - Volume 5 | Issue 2 | June 2017
DOI (Digital Object Identifier) -   
Publisher - IJEDR (ISSN - 2321-9939)
Cite this Article
  Neha Shukla,  Karan Chandel,   "Fault testing using SCOAP - Sandia controllability /observability analysis program", International Journal of Engineering Development and Research (IJEDR), ISSN:2321-9939, Volume.5, Issue 2, pp.2013-2017, June 2017, Available at :http://www.ijedr.org/papers/IJEDR1702313.pdf
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